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X-WR-TIMEZONE:America/New_York
BEGIN:VEVENT
SUMMARY:Efficient and Trustworthy Edge-Assisted Learning on AIoT Devices
DTSTART;TZID=America/New_York:20250225T121500
DTEND;TZID=America/New_York:20250225T131500
DTSTAMP:20260421T061142Z
UID:b7a31a5075b741dc9b1175488119ccbb@172.16.140.7:8080
CATEGORIES:ds,Mathematics and Computer Science
CONTACT:CISE S-STEM Mathematics and Computer Science Department.\, 718-262
 -2535\, arestrepo@york.cuny.edu\, https://forms.gle/pGvDU6gydveADzV59
CREATED:20250218T214100Z
DESCRIPTION:This event examines innovative methodologies for efficient and
  trustworthy edge-assisted learning on AIoT devices. Experts will discuss 
 advancements in edge computing\, secure data processing\, and AI integrati
 on to enhance performance on resource-constrained devices.
LAST-MODIFIED:20260112T162948Z
LOCATION:AC-2M04
URL:https://www.york.cuny.edu/events/2025/efficient-and-trustworthy-edge-a
 ssisted-learning-on-aiot-devices
END:VEVENT
BEGIN:VTIMEZONE
TZID:America/New_York
X-LIC-LOCATION:America/New_York
BEGIN:STANDARD
DTSTART:20241103T010000
TZNAME:EST
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
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